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August 20, 2004, 10:05 |
electrostatics
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#1 |
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Hi,
I have some experience using CFDRC for analysing fluid flow in mems devices and microchannels. This time I am trying to analyse the effect of negative surface charges on a silicon pillar like structure with an excess of holes in it. I have a boron doped silicon pillar and negatively charged molecular species sitting on the surface of this pillar and my objective is to find out how "deep" the external electric field generated by the negatively charged species penetrates into the pillar and how it effects the carrier mobility, carrier density and distribution within the pillar. Is CFDRC capable of doing such an analysis? I have created the pillar model in GEOM and when I import it into ACE and defne the PT and so on...where do I accomodate for the surface charges? If such an analysis can be done using CFDRC, it would be a great tool in modelling the kind of biological sensor I am trying to fabricate. Please advise. Thanks in advance, Mary. |
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